The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Oct. 05, 2006
Craig Alan Birckbichler, Chicora, PA (US);
Sudha Christy Jebadurai, Poland, OH (US);
Georg V. Wolfe, Butler, PA (US);
Ronald A. Puvak, Butler, PA (US);
William E. Schmidt, Gibsonia, PA (US);
Craig Alan Birckbichler, Chicora, PA (US);
Sudha Christy Jebadurai, Poland, OH (US);
Georg V. Wolfe, Butler, PA (US);
Ronald A. Puvak, Butler, PA (US);
William E. Schmidt, Gibsonia, PA (US);
AGR International, Inc., Butler, PA (US);
Abstract
A method of manufacturing plastic containers. The method may comprise the steps of (1) forming a plastic container from a preform in a blow-molder, where the blow-molder comprises a plurality of molds and spindles; and (2) inspecting the plastic container after formation in the blow-molder. The containers are inspected by impinging infrared light thereon and detecting the portion of the infrared light that passes through the container and converting the same into corresponding electrical signals which are delivered to a microprocessor. The microprocessor receives signals from sensors associated with the blow-molder relating to the position of the molds, the identity of the molds and the identity of the spindles in order that the information that is determined by inspection can be associated with specific molds and spindles. The information may be visually displayed so as to provide feedback regarding the inspection process. In a preferred embodiment wall thickness measurements are taken at several vertically spaced positions simultaneously. Corresponding apparatus is provided.