The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Jan. 14, 2005
Applicants:

Jonathan S. Yedidia, Cambridge, MA (US);

Marc P. C. Fossorier, Honolulu, HI (US);

Juntan Zhang, Cambridge, MA (US);

Yige Wang, Honolulu, HI (US);

Inventors:

Jonathan S. Yedidia, Cambridge, MA (US);

Marc P. C. Fossorier, Honolulu, HI (US);

Juntan Zhang, Cambridge, MA (US);

Yige Wang, Honolulu, HI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method generates a combined-replica group-shuffled iterative decoder. First, an error-correcting code and an iterative decoder for an error-correcting code is received. Multiple group-shuffled sub-decoders for the error-correcting code are constructed, based on the iterative decoder. Then, the multiple group-shuffled sub-decoders are combined into a combined-replica group-shuffled iterative decoder.


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