The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7373582 B1

PDF
Full Text
Expired
Date of Patent:
May. 13, 2008

Filed:

May. 24, 2005
Applicants:

Sung-jin Park, Seoul, KR;

Min-goo Kim, Yongin-si, KR;

Soon-jae Choi, Yongin-si, KR;

Inventors:

Sung-Jin Park, Seoul, KR;

Min-Goo Kim, Yongin-si, KR;

Soon-Jae Choi, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for turbo decoding using a variable window size. A control logic block receives information about a code rate of received data bits and a data block size, adjusts a window size according to the code rate information, and computes an initial delay. Delta metric blocks compute delta metrics from input data bits of the block size, wherein the delta metrics represent a transition probability for a path from a state to another state, respectively. An alpha metric block receives a delta metric in synchronization with the initial delay, and computes an alpha metric representing a forward state transition probability in each state. One or more beta metric blocks receive delta metrics according to the adjusted window size, and compute beta metrics representing a backward state transition probability in each state, respectively. A log likelihood ratio (LLR) block receives the alpha metric and the beta metrics in synchronization with the initial delay, and computes LLR values for symbols in an ending state. Code reliability is maintained by using a sliding window structure based on a window size varying with a code rate, while simultaneously reducing a decoding time due to an unnecessary initial delay.


Find Patent Forward Citations

Loading…