The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Dec. 19, 2005
Hiroyuki Hanamori, Tokyo, JP;
Kenji Asai, Tokyo, JP;
Hiroshi Yamasaki, Chiba, JP;
Osamu Endoh, Tokyo, JP;
Hiroyuki Hanamori, Tokyo, JP;
Kenji Asai, Tokyo, JP;
Hiroshi Yamasaki, Chiba, JP;
Osamu Endoh, Tokyo, JP;
Oki Electric Industry Co., Ltd., Tokyo, JP;
Abstract
A scan separator in a large scale integration device is made more extensive to suppress an increase in the circuit scale of the entire device. In one embodiment, a scan separator is provided for every two signal lines interconnecting two combinatorial circuit blocks. Each scan separator includes a selector and a flip flop for constituting a scan path. Another selector is provided for selecting one of the two signal lines. As an input selector signal for the selector that selects one of the two signal lines, data for switching controlling are used, which are transferred from a test input terminal over the scan path and latched by the flip flop. The data for switching controlling are initially transferred over the scan path to each flip flop. The selector that selects one of the two signal lines is switched in accordance with the switching controlling data stored in the flip flop. The switching controlling data may be interchanged to select the either of the two signal lines.