The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Mar. 30, 2005
Applicants:

Akira Kikutake, Kawasaki, JP;

Yasuhiro Onishi, Kawasaki, JP;

Kuninori Kawabata, Kawasaki, JP;

Inventors:

Akira Kikutake, Kawasaki, JP;

Yasuhiro Onishi, Kawasaki, JP;

Kuninori Kawabata, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A normal write data selection circuit operates in the normal operation mode, and thus outputs data received through external data terminals to any one of regular cell arrays selected according to an address. A test write control circuit operates in the test mode, and thus writes test data into a regular memory cell at a location corresponding to a location of a parity memory cell into which test parity data are written in each of regular cell arrays. Therefore, since a common test pattern can be used to test both the regular memory cell and the parity memory cell, test cost can be curtailed.


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