The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Dec. 08, 2004
Christopher H. Kingsley, San Jose, CA (US);
Kusuma Bathala, San Jose, CA (US);
Richard D. J. Duce, San Jose, CA (US);
Paul A. Swartz, Hillsborough, CA (US);
Christopher H. Kingsley, San Jose, CA (US);
Kusuma Bathala, San Jose, CA (US);
Richard D. J. Duce, San Jose, CA (US);
Paul A. Swartz, Hillsborough, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A system measures propagation delays in any number of test circuits, each having two asynchronous inputs and an output, without using their clock inputs to re-initialize the test circuits during measurement operations. The delay between one of the test circuit's asynchronous inputs and its output is measured by propagating a test signal from the one asynchronous input to the output, and the test circuit is re-initialized using the test circuit's other asynchronous input.