The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Feb. 03, 2005
Applicants:

Jonathan William Brawn, Austin, TX (US);

Simon John Craske, Cambridge, GB;

Peter Logan Harrod, Cambridge, GB;

Eric Jason Furbish, Austin, TX (US);

Inventors:

Jonathan William Brawn, Austin, TX (US);

Simon John Craske, Cambridge, GB;

Peter Logan Harrod, Cambridge, GB;

Eric Jason Furbish, Austin, TX (US);

Assignee:

ARM Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Software built in self test computer programsare generated using a genetic algorithmtechnique. A fault simulatoris used to simulate candidate software built in self test computer programs and compare the simulated execution, such to deliberately introduced test faults, with expected execution outcomes previously derived for that candidate program to determine the sensitivity of that candidate program to the faults which are introduced. This score can be fed back into the genetic algorithm mutation to converge the mutation process upon appropriately fault sensitive software built in self test program code.


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