The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Jun. 07, 2005
Tarek Eldin, San Jose, CA (US);
Himanshu J. Verma, Mountain View, CA (US);
Feng Wang, San Jose, CA (US);
Eric J Thorne, Santa Cruz, CA (US);
Tarek Eldin, San Jose, CA (US);
Himanshu J. Verma, Mountain View, CA (US);
Feng Wang, San Jose, CA (US);
Eric J Thorne, Santa Cruz, CA (US);
XILINX, Inc., San Jose, CA (US);
Abstract
A method for determining propagation delay differences for conductive lines of an integrated circuit is described. A first path is formed by coupling a first portion of conductive lines together. The first portion is associated with a first region of the integrated circuit. The first path is coupled in a ring oscillator, and a first delay is determined. A second path is formed by coupling a second portion of the conductive lines together. The second portion is the first portion except for at least a first conductive line in the first portion of the conductive lines being swapped for a second conductive line. The second conductive line is associated with a second region of the integrated circuit. The second path is coupled in the ring oscillator circuit. A second delay is determined, and an incremental difference between the first delay and the second delay may be determined.