The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Aug. 03, 2005
Soo-kwan Kim, Seongnam-si, KR;
Soo-Kwan Kim, Seongnam-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
A method of and system for detecting a measurement error. The method includes: receiving measurement data from a measurement unit and user expression data from a user; corresponding each of the received measurement data and expression data to any one section of a plurality of sections; and checking whether or not the corresponding two sections are consistent with each other, to detect an error of any one of the measurement data and the expression data when they are not consistent. The system includes: a measurement unit for measuring measurement data; a user inputting unit for receiving expression data from a user; a memory for storing a plurality of sections classifying values of the measurement data and the expression data; a section detecting unit for corresponding each of the measurement data and the expression data to any one of the stored plurality of sections; and an error detecting unit for checking whether or not the corresponding two sections are consistent, to detect an error of any one of the measurement data and the expression data when they are not consistent.