The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
May. 16, 2006
Robert C. Cohn, Beaverton, OR (US);
Susan C. Adam, Portland, OR (US);
Mark A. Briscoe, Beaverton, OR (US);
Andrew Loofburrow, Portland, OR (US);
Eric E. Thums, Portland, OR (US);
Robert C. Cohn, Beaverton, OR (US);
Susan C. Adam, Portland, OR (US);
Mark A. Briscoe, Beaverton, OR (US);
Andrew Loofburrow, Portland, OR (US);
Eric E. Thums, Portland, OR (US);
Tektronix, Inx., Beaverton, OR (US);
Abstract
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text. Some of the analog-type measurements, among others, are pulse width, duty cycle, period, frequency, period jitter, and cycle-to-cycle jitter