The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Mar. 15, 2002
Yuki Tokuhashi, Hachioji, JP;
Yoshinobu Tanaka, Hachioji, JP;
Yuki Tokuhashi, Hachioji, JP;
Yoshinobu Tanaka, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A three-dimensional image evaluation unit () for evaluating an input image. The parallax statistic is calculated by measuring the parallax included in the input image by a parallax measuring means (), the static parallax evaluation value for the calculated parallax statistic and/or a dynamic parallax evaluation value for a temporal change in the parallax statistic is determined by a static parallax evaluating means (-) and/or a dynamic parallax evaluating means (-) of an evaluating means () to evaluate parallax information on the image. An abrupt change in the parallax can be evaluated thereby, and countermeasures against errors in measurement and noise of the image can be taken, so that parallax information on the image can be suitably evaluated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile