The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Dec. 11, 2003
Applicant:

Stephen C. Booth, Fort Collins, CO (US);

Inventor:

Stephen C. Booth, Fort Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 (2006.01); H04M 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system having a diagnostic measurement system (DMS) and method include a multi-protocol application test identifying components corresponding to protocols mixed within the multi-protocol application test, executing the protocols to collect measurements of the components, combining the measurements of the components to generate measurements corresponding to the multi-protocol application test, and outputting the measurements of the multi-protocol application test to the DMS, wherein the multi-protocol application test defers outputting the measurements of the components to the DMS as the measurements are collected from each protocol.


Find Patent Forward Citations

Booth, Stephen. (2008). Measurement deferral and aggregation for extensible test configuration (U.S. Patent No. 7372946). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7372946

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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