The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Jul. 15, 2005
Applicants:

GE Wang, Iowa City, IA (US);

Yangbo YE, Coralville, IA (US);

Inventors:

Ge Wang, Iowa City, IA (US);

Yangbo Ye, Coralville, IA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided herein are methods of reconstructing an image from projection data provided by a tomography scanner that is based on geometric optics comprising scanning an object in a cone-beam imaging geometry following a non-standard spiral path or a general piecewise smooth scanning path wherein projection data is generated and reconstructing an image according to a closed-form formula that is either in the filtered backprojection (FBP) or backprojection filtration (or backprojected filtration, BPF) formats. Also provided herein are associated systems and apparatuses for tomographic imaging.


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