The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
May. 10, 2001
Pascal Villa, Cassis, FR;
Michel Delaage, Marseille, FR;
Toni Williamson, Cassis, FR;
Trophos, Marseille Cedex, FR;
Abstract
The invention concerns methods and devices for observing or analysing samples on a support. More particularly, it concerns a device for sequential observation of several samples arranged on a common plate () comprising an objective () for observing a stage () for positioning the plate () adapted to ensure a relative displacement between the plate () and the observation axis in a plane perpendicular to the observation axis, while leaving free the vertical displacement along the observation axis, means () for illuminating the sample and means () for acquiring an image at the objective () output. It comprises a spacer () fixed relative to the objective () and having a support surface () on the support (), said support surface being located proximate to the observation axis, so that said spacer () is adapted to maintain, on the observation axis, a constant distance between the objective () and the observation surface (), during a relative displacement between the support () and the observation axis. The invention is useful for rapid analysis of cell samples.