The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Oct. 11, 2002
Steven P. Kaufman, Hooksett, NH (US);
Arkady Savikovsky, Needham, MA (US);
Steven P. Kaufman, Hooksett, NH (US);
Arkady Savikovsky, Needham, MA (US);
Laser Projection Technologies, Inc., Londonderry, NH (US);
Abstract
A method and system for visualizing deviations on an actual surfacefrom a nominal, or designed, surfaceutilizes a system and method for mapping the spatial (e.g. x, y and z) coordinates of the actual surfaceinto a computer, comparing the mapped actual surface to the nominal surfaceto produce a three-dimensional distribution of deviation values (D), processing this distribution into a topographical patternof multiple contours or areas, each contour or area having the same, or generally the same, deviation value (D), and optically projecting this topographical patternonto the actual surfacein registry with the initial surface mapping to provide a display of the surface deviations (D) directly on the actual surface. The deviations are measured along a direction D normal to the actual surface so that the three-dimensional distribution is given in x, y, D coordinates. The optical projection is preferably a laser projection. The mapping and projection onto the actual surfaceare made, and coordinated with one another, with respect to three reference pointson the surface