The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Oct. 31, 2005
Applicants:

Roger W Engelbart, St. Louis, MO (US);

Reed Hannebaum, Belleville, IL (US);

Tim Pollock, Ballwin, MO (US);

Sam Orr, Barnhart, MO (US);

Jeff Putnam, St. Louis, MO (US);

Eric Rector, St. Charles, MO (US);

Inventors:

Roger W Engelbart, St. Louis, MO (US);

Reed Hannebaum, Belleville, IL (US);

Tim Pollock, Ballwin, MO (US);

Sam Orr, Barnhart, MO (US);

Jeff Putnam, St. Louis, MO (US);

Eric Rector, St. Charles, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of inspecting material laid by a material placement machine. Light is directed onto the material in a direction essentially normal to the material to illuminate a section of the material. Laser energy is projected onto the section at an angle predetermined to reveal inconsistencies in the section. This system provides improved illumination for material widths exceeding six inches and is scalable for inspecting various material widths.


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