The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Aug. 19, 2005
Kazuma Yokoi, Hitachi, JP;
Hiroshi Kitaguchi, Naka, JP;
Takafumi Ishitsu, Hitachi, JP;
Naoyuki Yamada, Hitachinaka, JP;
Kensuke Amemiya, Hitachinaka, JP;
Yuuichirou Ueno, Hitachi, JP;
Katsutoshi Tsuchiya, Hitachi, JP;
Norihito Yanagita, Hitachi, JP;
Kazuma Yokoi, Hitachi, JP;
Hiroshi Kitaguchi, Naka, JP;
Takafumi Ishitsu, Hitachi, JP;
Naoyuki Yamada, Hitachinaka, JP;
Kensuke Amemiya, Hitachinaka, JP;
Yuuichirou Ueno, Hitachi, JP;
Katsutoshi Tsuchiya, Hitachi, JP;
Norihito Yanagita, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In a radiological imaging apparatus, a radiation detecting section includes semiconductor detectors arranged in four columns and four rows. Each of the semiconductor detectors includes a semiconductor base material, and an anode electrode film (first electrode film) and a cathode electrode film (second electrode film) lying opposite each other so as to sandwich the semiconductor base material between them. A first conductive member is installed on each first electrode film. Second electrode films of four semiconductor detectors within a row are connected together using one second conductive member. A shaping amplifier connected to the first conductive members with a wire executes a waveform shaping process using a shaping time shorter than that of a shaping amplifier connected to the second conductive member with a wire; the first conductive members are provided for the four semiconductor detectors within a column.