The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2008

Filed:

Jan. 18, 2006
Applicants:

Daniel Sobek, Portola Valley, CA (US);

Jing Cai, Stanford, CA (US);

Kevin Killeen, Palo Alto, CA (US);

Hongfeng Yin, Cupertino, CA (US);

Inventors:

Daniel Sobek, Portola Valley, CA (US);

Jing Cai, Stanford, CA (US);

Kevin Killeen, Palo Alto, CA (US);

Hongfeng Yin, Cupertino, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion source for an analytical instrument is described. The ion source comprises a capillary tip and counter-electrode interface and a feedback loop control device connected to the capillary tip and counter-electrode interface. The feedback loop control device comprises a transimpedance amplifier, a DC de-coupler, a frequency to voltage converter, a controller, and a voltage-controlled high-voltage power supply that provides a tip to counter-electrode voltage to the capillary tip and counter-electrode interface. The feedback loop control device measures the modulation frequency of ionization currents and provides a feedback adjustment of the tip-to-counter-electrode voltage to maintain ionization efficiency.


Find Patent Forward Citations

Loading…