The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2008
Filed:
Jul. 29, 2002
Youssef Wakil, Houston, TX (US);
Ioannis Pallikaris, Crete, GR;
Vasyl Molebny, Kiev, UA;
Tracey Technologies, LLC, Houston, TX (US);
Abstract
An apparatus and method for measuring refractive characteristics of human eyes with an objective refraction measuring device for measuring refraction in at least one eye, the objective refraction measuring system having a proximal end and a distal end, the objective refraction measuring system suitable for looking in the proximal end and seeing out the distal end; an open field visual target. An open viewing lane is provided between the eye and the open field visual target, the viewing lane has sufficient length to allow for focusing the eye at infinity and for natural accommodation at true distance targets, such near distances such as reading distances. The objective refraction measuring device can be positioned in the viewing lane to measure the eye while the eye is focused on the open field visual target.