The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

May. 25, 2004
Applicants:

Anatoly Koyfman, Kiryat Yam, IL;

Allon Adir, Kiryat Tivon, IL;

Roy Emek, Tel-Aviv-Jaffa, IL;

Yoav Katz, Haifa, IL;

Michael Vinov, Haifa, IL;

Inventors:

Anatoly Koyfman, Kiryat Yam, IL;

Allon Adir, Kiryat Tivon, IL;

Roy Emek, Tel-Aviv-Jaffa, IL;

Yoav Katz, Haifa, IL;

Michael Vinov, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems are disclosed that enhance the ability of a test generator to automatically deal with address translation in a processor design, and without need for creating specific code. A model of the address translation mechanism of a design-under-test is represented as a directed acyclic graph and then converted into a constraint satisfaction problem. The problem is solved by a CSP engine, and the solution used to generate test cases for execution. Using the model, testing knowledge can be propagated to models applicable to many different designs to produce extensive coverage of address translation mechanisms.


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