The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Dec. 19, 2003
Sekhar Lakkapragada, San Jose, CA (US);
Ambujavalli Kesavan, San Jose, CA (US);
Sekhar Lakkapragada, San Jose, CA (US);
Ambujavalli Kesavan, San Jose, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Methods and apparatus, including computer program products, implementing and using techniques for testing a data service on a computing cluster having several computing nodes. A test package is installed on a test administration machine and on one or more of the computing nodes in the computing cluster. Data service configuration information is collected for the data service to be tested. Computing cluster configuration information is collected. The data service configuration information and the computing cluster configuration information are distributed to one or more of the computing nodes in the computing cluster. The data service is tested on the computing cluster by applying one or more data service test suites in the test package to the data service. A report containing results of the application of one or more of the data service test suites to the data service is generated.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile