The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Dec. 03, 2002
Applicants:

Douglas R. Burdick, Ithaca, NY (US);

Robert J. Szczerba, Endicott, NY (US);

Joseph H. Visgitus, Endwell, NY (US);

Inventors:

Douglas R. Burdick, Ithaca, NY (US);

Robert J. Szczerba, Endicott, NY (US);

Joseph H. Visgitus, Endwell, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system evaluates a first data cleansing application and a second data cleansing application. The system includes a test data generator, an application execution module, and a results reporting module. The test data generator creates a dirty set of sample data from a clean set of data. The application execution module cleanses the dirty set of sample data. The application execution module utilizes the first data cleansing application to cleanse the dirty set of sample data and create a first cleansed output. The application execution module further utilizes the second data cleansing application to cleanse the dirty set of sample data and create a second cleansed output. The results reporting module evaluates the first and second cleansed output. The results reporting module produces an output of scores and statistics for each of the first and second data cleansing applications.


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