The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Feb. 26, 2004
Jibril Odogba, Wales, WI (US);
Kenneth Scott Kump, Waukesha, WI (US);
Jibril Odogba, Wales, WI (US);
Kenneth Scott Kump, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A system and method for asynchronous calibration of a solid-state detector are provided. A first offset is obtained with a first frame interval. A second offset image is obtained with a second frame interval that is shorter than the first frame interval. A third offset image is obtained with a third frame interval that is longer than the first frame interval. The first offset image is offset with each of the second offset image and the third offset image to produce offset comparison images. Pixels in the offset comparison images with an intensity value that exceeds an asynchronous threshold intensity value are identified as asynchronous bad pixels and added to a bad pixel map. Subsequently acquired x-ray images are offset with corresponding offset images. The bad pixel map is used to identify asynchronous bad pixels in the displayed images.