The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Oct. 14, 2003
Applicants:

Jong-won Kim, Yongin, KR;

Dong-hyun Lee, Seoul, KR;

Seong-cheol Hong, Suwon, KR;

Inventors:

Jong-Won Kim, Yongin, KR;

Dong-Hyun Lee, Seoul, KR;

Seong-Cheol Hong, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit () that lands an inspected object () safely thereon and transfers the inspected object () to a predetermined position; a light generating unit () that is installed below the transfer unit () and emits a light having a predetermined wavelength to the inspected object (); a light amplifying unit () that is installed on the opposite side of the light generating unit () to convert and amplify a predetermined light that transmits the inspected object () into a visible light; an optical unit () that optically illuminates the inspected object () to create a visual image; and a camera () that receives an X-ray image amplified through the light amplifying unit () or a visual image by the optical unit () to obtain information.


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