The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Dec. 18, 2000
Alexander Kravtchenko, Villingen-Schwenningen, DE;
Marten Kabutz, Villingen-Schwenningen, DE;
Bruno Peytavin, Grenoble, FR;
Alexander Kravtchenko, Villingen-Schwenningen, DE;
Marten Kabutz, Villingen-Schwenningen, DE;
Bruno Peytavin, Grenoble, FR;
Thomson Licensing, Boulogne Billancourt, FR;
Abstract
The present invention relates to a device for reading from and/or writing to optical recording media () having an optical scanner () for scanning the recording medium () by means of a light beam () and for generating scanning signals (HF) from the reflected beam (), a data slicer () for converting a scanning signal (HF) output by the optical scanner () into a binary signal (HF″), an averaging unit () for forming an average value (M) from the scanning signal (HF, HF″) as input signal of the data slicer (), and a control unit () for changing a parameter (T, OF) of the averaging unit (). The object of the present invention is to propose a device of this type and also a suitable method therefor in which the average value (M) can be adapted to disturbances during the scanning of the recording medium. According to the invention, this is achieved by virtue of the fact that the control unit () has a unit () for outputting a comparison value (S, HFN) and a comparator () for comparing the average value (M) with this comparison value (S, HFN), and triggers a chance in the parameter (T, OF) in the event of the comparison value exceeded or undershot.