The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Feb. 04, 2005
Hiroshi Tsuruta, Machida, JP;
Hiroshi Sasaki, Tokyo, JP;
Kenichi Kusaka, Hachioji, JP;
Akinori Araya, Yokohama, JP;
Tatsuo Nakata, Hino, JP;
Hiroshi Tsuruta, Machida, JP;
Hiroshi Sasaki, Tokyo, JP;
Kenichi Kusaka, Hachioji, JP;
Akinori Araya, Yokohama, JP;
Tatsuo Nakata, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A total internal reflection fluorescence microscope includes a light source which generates laser light having a plurality of wavelengths, a focal optical system which irradiates the laser light from the light source on a specimen at a predetermined incident angle via an objective lens and which generates evanescent illumination, a fluorescence observation unit which observes fluorescence generated from the specimen due to the evanescent illumination, an incident angle adjuster which adjusts the incident angle of the laser light irradiated on the specimen, and a controller which controls the incident angle adjuster such that the amount of the permeation depth of the evanescent light is the same when the wavelength of the laser light from the laser light source is switched.