The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Mar. 23, 2006
Dug Young Kim, Gwangju, KR;
Tae Jung Ahn, Gwangju, KR;
Dug Young Kim, Gwangju, KR;
Tae Jung Ahn, Gwangju, KR;
Gwangju Institute of Science and Technology, Buk-gu, Gwangju, KR;
Abstract
Disclosed herein is an apparatus for measuring the differential mode delay of multimode optical fiber. The apparatus includes a tunable laser source, an interferometer, a data collecting device, and a computer. The tunable laser source outputs light, frequencies of which vary linearly. The interferometer generates multimode light and single mode light by separating light, which is output from the tunable laser source, transmitting the multimode light and the single mode light to the multimode optical fiber, which is a measurement target, and a single mode path, which is a reference, and generating a beating signal by causing the multimode light and the single mode light to interfere with each other. The data collecting device collects the beating signal from the interferometer. The computer converts the frequency components of the beating signal into components in a time domain, and calculating the mode delay of the multimode light.