The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

May. 21, 2004
Applicants:

Yoshiki Sakaino, Asaka, JP;

Yoshihiko Abe, Asaka, JP;

Kaoru Terashima, Asaka, JP;

Inventors:

Yoshiki Sakaino, Asaka, JP;

Yoshihiko Abe, Asaka, JP;

Kaoru Terashima, Asaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measuring apparatus comprises: an illuminating section that illuminates a first object with a first light; a light changing section that changes an intensity of the first light illuminating the first object; a light receiving device that receives a second light transmitted through or reflected from the first object; and an output section that outputs a measurement result according to i) a state of the light changing section and ii) an amount of the second light received by the light receiving device. In addition, an optical measuring apparatus comprises: the illuminating section; the light receiving device; a light receiving time changing section that changes a light receiving time of the light receiving device; and an output section that outputs a measurement result according to i) the light receiving time and ii) an amount of the second light received by the light receiving device.


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