The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Jul. 20, 2006
Mark Matthew Abbott, Dundas, MN (US);
Douglas Phillip Wornson, Northfield, MN (US);
Eric Loren Hegstrom, Tucson, AZ (US);
Mark Matthew Abbott, Dundas, MN (US);
Douglas Phillip Wornson, Northfield, MN (US);
Eric Loren Hegstrom, Tucson, AZ (US);
Litesentry Corporation, Dundas, MN (US);
Abstract
An apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a sheet of glass, are described. A sensor detects a transparent light reflective coating on a transparent sheet and defines a sample profile. An optical inspection system utilizes an illumination source and an imaging device to obtain images of the transparent sheets. An image processing system analyzes for defects in the transparent sheets, including coating defects and defects in edge deleted perimeters. Inspection variables which correspond to the sample profile are used by the optical inspection system and image processing system for real-time inspection.