The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Oct. 18, 2005
Applicants:
Brian R. Bernier, Tampa, FL (US);
Jason Waltuch, St. Petersburg, FL (US);
Inventors:
Brian R. Bernier, Tampa, FL (US);
Jason Waltuch, St. Petersburg, FL (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A tamper response system to protect intellectual property is provided. In one embodiment, the tamper response system includes at least one sensor adapted to sense tamper activity and a tamper circuit. The tamper circuit is coupled to receive tamper signals from the at least one sensor. Moreover, the tamper circuit is adapted to clear at least one field programmable gate array (FPGA) upon receipt of a tamper signal.