The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2008

Filed:

Sep. 08, 2005
Applicants:

Jacobus Johannus Maria Van Dongen, Niewekerk Aan de Ijssel, NL;

Karl-johan Pluzek, Smorum, DK;

Kirsten Vang Nielsen, Bronshoj, DK;

Kim Adelhorst, Holte, DK;

Inventors:

Jacobus Johannus Maria Van Dongen, Niewekerk Aan de Ijssel, NL;

Karl-Johan Pluzek, Smorum, DK;

Kirsten Vang Nielsen, Bronshoj, DK;

Kim Adelhorst, Holte, DK;

Assignee:

Dako Denmark A/S, Glostrup, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C07H 21/00 (2006.01); C07H 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A novel method for detecting chromosome aberrations is disclosed. More specifically, chromosome aberrations are detected by in situ hybridisation using at least two sets of hybridisation probes, at least one set comprising one or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to a potential aberration in a chromosome, and at least one set comprising two or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to another potential aberration in a chromosome. In particular, the method may be used for detecting chromosome aberrations in the form of breakpoints.


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