The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Jun. 14, 2005
Xin Miao, Menlo Park, CA (US);
James Ireland, San Francisco, CA (US);
Paul Hardenbol, San Francisco, CA (US);
Thomas Matthew Daly, Indianapolis, IN (US);
Dong-jing Fu, Carmel, IN (US);
Richard D. Hockett, Fishers, IN (US);
Xin Miao, Menlo Park, CA (US);
James Ireland, San Francisco, CA (US);
Paul Hardenbol, San Francisco, CA (US);
Thomas Matthew Daly, Indianapolis, IN (US);
Dong-Jing Fu, Carmel, IN (US);
Richard D. Hockett, Fishers, IN (US);
Affymetrix, Inc., Santa Clara, CA (US);
Abstract
The invention provides a method for genotyping interfering polymorphic loci in a target polynucleotide, such as a strand of genomic DNA, in a multiplex hybridization-based assay. The invention also provides nucleic acid standards for validating the performance of such hybridization-based assays. In one aspect, the method of the invention is carried out by providing for each interfering polymorphic locus one or more probes so that at least one probe is capable of forming a perfectly match duplex at the locus regardless of the characteristic sequence of an adjacent polymorphism.