The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2008
Filed:
Jun. 23, 2006
Applicant:
Junichi Akita, Nukata-gun, JP;
Inventor:
Junichi Akita, Nukata-gun, JP;
Assignee:
Nidek Co., Ltd., Gamagori-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for observing an eye of an examinee by imaging the eye, includes an irradiation optical system; an imaging optical system; a monitor; and a display control part, wherein the imaging optical system includes a wavefront detector which receives the beam reflected by the objective part to detect wavefront aberration thereof and a wavefront compensator adapted to compensate the wavefront aberration based on a detection result of the wavefront detector, the wavefront compensator being placed within an optical path of the imaging optical system excepting a common optical path with the irradiation optical system.