The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7367132 B1

PDF
Full Text
Expired
Date of Patent:
May. 06, 2008

Filed:

Mar. 17, 2006
Applicant:

Tadashi Mitsuhashi, Tokorozawa, JP;

Inventor:

Tadashi Mitsuhashi, Tokorozawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/00 (2006.01); G01B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A contact-type displacement measuring apparatus includes a first movable body that reciprocates in a first linear direction; a driving unit that drives the first movable body; a second movable body that reciprocates in a second linear direction parallel to the first linear direction, in association with movement of the first movable body; a probe detachably arranged at a tip of the second movable body; a measuring force detecting unit that detects, at a rear end of the second movable body, a measuring force to an object when the probe is in contact with the object; a position detecting unit that detects, between the probe and the measuring force detecting unit, an amount of movement of the second movable body; and a control device that controls the amount of movement such that the measuring force is kept constant corresponding to an output of the measuring force detecting unit.


Find Patent Forward Citations

Mitsuhashi, Tadashi. (2008). Contact-type displacement measuring apparatus (U.S. Patent No. 7367132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7367132

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