The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

May. 24, 2002
Applicants:

Farzan Fallah, San Jose, CA (US);

Koichiro Takayama, San Jose, CA (US);

Inventors:

Farzan Fallah, San Jose, CA (US);

Koichiro Takayama, San Jose, CA (US);

Assignee:

Fujitsu, Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for generating processor test programs using a formal description of the processor's instruction set. An instruction set for a processor is formally described using a language such as ISDL. The formal description of the instruction set identifies certain characteristics of the instructions making up the instruction set. The formal description is combined with a test specification that describes desired properties of a test program by formally specifying test sequences that are to be applied to instructions having particular characteristics. A test program is generated by applying the formal test specification to the formal description of the instruction set including test sequences applicable to instructions having the particular characteristics.


Find Patent Forward Citations

Loading…