The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

Oct. 11, 2001
Applicants:

John Gerard Beerends, Hengstdijk, NL;

Andries Pieter Hekstra, Eindhoven, NL;

Symon Ronald Appel, Haarlem, NL;

Inventors:

John Gerard Beerends, Hengstdijk, NL;

Andries Pieter Hekstra, Eindhoven, NL;

Symon Ronald Appel, Haarlem, NL;

Assignee:

Koninklijke KPN N.V., The Hague, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

For measuring the influence of noise on the talking quality of a telephone link in a telecommunications network, a talker speech signal (s(t)) and a degraded speech signal (s'(t)) are fed to an objective measurement device for obtaining an output signal (q) representing an estimated value of the talking quality. The degraded signal includes a returned signal (r(t)) originating from the network during transmission of the talker speech signal over the telephone link. The objective measurement provided by the device is a modified PSQM-like measurement, which is modified to include modelling of masking effects resulting from noise present in the returned signal. Preferably, the modelling includes noise suppression performed on a difference signal (D(t,f)) in a loudness density domain using noise estimation.


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