The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Mar. 18, 2005
Kentaro Hazama, Musashino, JP;
Makoto Ishii, Musashino, JP;
Yukihiro Seki, Musashino, JP;
Yokogawa Electric Corporation, Musashino-shi, JP;
Abstract
A calibration method in which secular change in sensor output values obtained at calibration times is estimated and the next calibration date can be determined at an appropriate interval and a zirconia-type oxygen analyzer using the above calibration method is achieved. The present invention is characterized by the fact that, in a calibration method in which a standard sample having a known value is measured and the output value of a measuring instrument corresponding to a sensor output value at the time of measurement is calibrated, the sensor output value obtained in implemented calibrating operations is stored in succession as the data for calibration history and the state of secular change in said sensor output value is estimated based on the stored past data for calibration history to determine the next calibration date.