The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

Dec. 23, 2005
Applicants:

Devin Mcpherson, Arlington, VA (US);

Deborah Lynn Althoff, Arlington, VA (US);

Scott Lilienthal, Laurel, MD (US);

Inventors:

Devin McPherson, Arlington, VA (US);

Deborah Lynn Althoff, Arlington, VA (US);

Scott Lilienthal, Laurel, MD (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A database system and method are provided to allow a user to characterize observations related to an otherwise unidentified process. A database is established that stores data for substances, processes and equipment according to a data model that relates attributes of substances, processes and equipment. Information related to observations, called observed data or observables, is entered by a user into the system as the search criteria. The observed data may range in complexity from the names of one or more substances and/or processing equipment to a text description of the odor, color and state of observed substances and/or equipment. The system searches the database using the search criteria to return a list of one or more processes that possibly create the observed data, and thus more completely characterize the process.


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