The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Jul. 31, 2006
Susan Herron, Ridgefield, CT (US);
James Grau, Ridgefield, CT (US);
Bradley Roscoe, Ridgefield, CT (US);
Michael Herron, Ridgefield, CT (US);
Kenneth Stephenson, Belmont, MA (US);
Susan Herron, Ridgefield, CT (US);
James Grau, Ridgefield, CT (US);
Bradley Roscoe, Ridgefield, CT (US);
Michael Herron, Ridgefield, CT (US);
Kenneth Stephenson, Belmont, MA (US);
Schlumber Technology Corporation, Ridgefield, CT (US);
Abstract
Methods and apparatus are provided for determining the content of a first element in a formation which cannot otherwise be determined via a capture spectrum measurement. The methods and apparatus utilize the inelastic spectrum measurement of the first element and the inelastic and capture spectrum measurements of at least a second element. The methods and apparatus have particular application to determining the carbon content of a formation although they are not limited thereto. The inelastic and capture spectrum measurements of silicon are useful in making such determinations, although other chemical elements may be used as the second element.