The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Dec. 24, 2003
Applicants:
Tetsuro Takamatsu, Kyoto, JP;
Katsumasa Fujita, Osaka, JP;
Inventors:
Tetsuro Takamatsu, Kyoto, JP;
Katsumasa Fujita, Osaka, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In an optical microscope, a pair of convergence/collimation lenses () are arranged in the common optical axis of a light beam directed toward a sample () being observed through an objective lens () and a light beam radiated or reflected from the sample to pass through the objective lens respectively. A means () varying the phase of the transmitting light beam is varied within a specified range is provided between these lenses so that the sample is irradiated while being focused at a depth corresponding to the phase at the wave front of the light beam entering the objective lens.