The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Jun. 18, 2004
Daniel A. Usikov, Newark, CA (US);
Daniel A. Usikov, Newark, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A system and method for performing optical inspection are provided. At least one 'invariant feature' of an object design is determined, and such invariant feature is used in inspecting objects having the corresponding design. An 'invariant feature' is a feature that is invariant certain transformations occurring in a captured image of an object under inspection, such as brightness, color, and/or other transformations in the captured image. Accordingly, an inspection template may comprise information corresponding to at least one pre-selected invariant feature of an object's design. In certain embodiments, the template is a shape description of a feature that provides an intrinsic invariance to a specified set of basic transformations. Accordingly, the amount of pixel values stored in a template may be minimized, which minimizes the number of pixel comparisons made between a captured image of the object under inspection and the inspection template during the inspection analysis.