The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

Mar. 14, 2002
Applicants:

Hitoshi Hashimoto, Sagamihara, JP;

Keiichi Mori, Hachioji, JP;

Takayuki Kijima, Akiruno, JP;

Hideaki Yoshida, Hachioji, JP;

Inventors:

Hitoshi Hashimoto, Sagamihara, JP;

Keiichi Mori, Hachioji, JP;

Takayuki Kijima, Akiruno, JP;

Hideaki Yoshida, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/217 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging apparatus comprises an imaging element, an imaging optical system configured to input an image of an object to the imaging element, a non-volatile memory part for storing defect data concerning the imaging element, and includes a first memory area storing initial defect data concerning the imaging element, and a second memory area different from the first memory area, a defect detection part for detecting defect data concerning the imaging element, and a control part for controlling reading and writing of the defect data on the imaging element from and to the non-volatile memory part, the control part writing, to the second memory area, defect data detected by the defect detection part.


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