The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2008

Filed:

Jul. 06, 2006
Applicants:

David N. Strafford, Pittsford, NY (US);

Brian M. Charles, Rochester, NY (US);

Timothy S. Lewis, Rochester, NY (US);

William C. Lebbon, Rochester, NY (US);

James M. Warner, Rochester, NY (US);

Inventors:

David N. Strafford, Pittsford, NY (US);

Brian M. Charles, Rochester, NY (US);

Timothy S. Lewis, Rochester, NY (US);

William C. Lebbon, Rochester, NY (US);

James M. Warner, Rochester, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 5/00 (2006.01); B24B 29/00 (2006.01); B24D 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, system and method for grinding or polishing an optic is provided. The apparatus includes a shell adapted to a bending profile, torque actuators attached at an outer edge of the shell and coupled to each other, a tensioning system attached at the outer edge of the shell, and a control system for computing the bending profile and controlling the torque actuators and tensioning system. The torque actuators and tensioning system apply bending moments to the edge of the shell to adapt the shell according to the bending profile provided by the control system. A calibration system further corrects errors in a measured bending profile.


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