The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2008
Filed:
Oct. 31, 2006
Akihiro Hayashi, Toyokawa, JP;
Masaaki Hanebuchi, Nukata-gun, JP;
Tetsuyuki Miwa, Nukata-gun, JP;
Mikio Kurachi, Hazu-gun, JP;
Akihiro Hayashi, Toyokawa, JP;
Masaaki Hanebuchi, Nukata-gun, JP;
Tetsuyuki Miwa, Nukata-gun, JP;
Mikio Kurachi, Hazu-gun, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An ophthalmic apparatus with which it is easy to open eyelids of an examinee at the time of intraocular pressure measurement has a measurement unit including an measurement part measuring intraocular pressure by blowing fluid to a cornea of an examinee's eye via a nozzle to deform the cornea and a measurement part having a measurement optical system for measuring eye characteristics of the eye, wherein the intraocular pressure measurement part is placed above the eye characteristic measurement part, a device making a selective changeover between an intraocular pressure measurement mode and an eye characteristic measurement mode, and a first movement mechanism part moving the measurement unit in an up-and-down direction with respect to the eye so that a measurement optical axis of either of the measurement parts to be used for the selected mode is positioned at approximately the same height as the examinee's eye.