The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Sep. 15, 2004
Karthik Kalyanaraman, Bellevue, WA (US);
Karthik Kalyanaraman, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods for a test harness that are provided that allow for effective control over both the data records and the test methods that are used in a software test run. Data records and/or test methods can be associated with a priority, such that a level of priority may be selected for a particular test run, and substantially only data records and test methods of the selected priority are used in the test. The invention may be implemented as a data driven test pattern class library. The data driven test pattern class library may generate concrete prioritized test cases dynamically using code document object model (code DOM) for substantially each data record by using a class decorated with known custom attributes. The invention can be used to help testers implement data driven tests effectively and in an easily maintainable fashion with minimal code.