The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Feb. 23, 2005
David Mark, San Jose, CA (US);
Yuezhen Fan, San Jose, CA (US);
David Mark, San Jose, CA (US);
Yuezhen Fan, San Jose, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
According to one aspect of the invention, a circuit for determining the location of a defect in an integrated circuit is described. The circuit comprises a conductor extending from a first node to a second node and a test signal driver coupled to the first node of the conductor. The test signal driver receives a test signal using a first clock signal, while a plurality of detector circuits coupled to the conductor between the first node and the second node to detect an output at the plurality of nodes using a second clock signal. According to other embodiments, circuits for determining the location of a defect in a programmable logic device are disclosed. Finally, various methods for determining the location of a defect in an integrated circuit are described.