The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7363178 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 22, 2008

Filed:

Oct. 31, 2006
Applicants:

David William Boerstler, Round Rock, TX (US);

Eskinder Hailu, Austin, TX (US);

Jieming Qi, Austin, TX (US);

Bin Wan, Pittsburgh, PA (US);

Inventors:

David William Boerstler, Round Rock, TX (US);

Eskinder Hailu, Austin, TX (US);

Jieming Qi, Austin, TX (US);

Bin Wan, Pittsburgh, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, the disclosed methodology and apparatus measure relative duty cycle information of a clock signal with respect to an input node as the clock signal travels to selected nodes of a clock distribution network on an electronic circuit. The apparatus operates in a benchmark mode to determine benchmark duty cycle information and then subsequently operates an a relative mode to determine relative duty cycle information of the clock signal at a selected node in comparison to the clock signal at an external input node.


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Boerstler, David. (2008). Method and apparatus for measuring the relative duty cycle of a clock signal (U.S. Patent No. 7363178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7363178

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