The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2008
Filed:
Aug. 05, 2004
Nathan Intrator, Providence, RI (US);
Ki-o Kim, Providence, RI (US);
Nicola Neretti, Jamaica Plain, MA (US);
Leon N. Cooper, Providence, RI (US);
Nathan Intrator, Providence, RI (US);
Ki-o Kim, Providence, RI (US);
Nicola Neretti, Jamaica Plain, MA (US);
Leon N. Cooper, Providence, RI (US);
Brown University, Providence, RI (US);
Abstract
A system and method for increasing the accuracy of time delay estimates of signals propagating through an environment. The system includes one or more sensors for receiving a plurality of signals, and a time delay estimator for measuring time delays between multiple pairs of signals. At least some of the multiple pairs of signals are received and measured at different points in time. The system further includes a data analyzer for analyzing time delay estimation data, for generating a statistical distribution of time delay estimates from the data, and for calculating a statistical estimate of time delay from the distribution. By increasing the number of signals employed by the system, the accuracy of the time delay estimation is increased. Further, by calculating the median or the mode of the statistical distribution, noise tolerance is improved.