The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Jul. 15, 2005
Applicants:

Masami Kishiro, Tokyo, JP;

Toshihiro Yamamoto, Tokyo, JP;

Hironobu Yao, Tokyo, JP;

Yoshinori Ohmuro, Tokyo, JP;

Noritomo Hirayama, Tokyo, JP;

Inventors:

Masami Kishiro, Tokyo, JP;

Toshihiro Yamamoto, Tokyo, JP;

Hironobu Yao, Tokyo, JP;

Yoshinori Ohmuro, Tokyo, JP;

Noritomo Hirayama, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 17/00 (2006.01); G01F 23/00 (2006.01); G01L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for measuring a flow velocity profile of fluid traveling in a pipe or conduit uses an ultrasonic wave transmitted from an ultrasonic wave transducer mounted at an angle on the outside of a pipe using a wedge, and made incident onto the fluid in the pipe to measure the fluid flow velocity profile, using the principle that a frequency of an ultrasonic wave, reflected by a reflector existing in the fluid, is changed depending on a flow velocity due to Doppler effect. The transmission frequency and the angle of incidence onto the pipe can be selected to suppress frequency dependence of a measured value due to Lamb wave and allow the flow velocity or flow rate of fluid to be measured with a greater accuracy.


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