The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2008

Filed:

Jan. 05, 2007
Applicants:

Jonathan Nichols, Crofton, MD (US);

Mark Seaver, Burtonsville, MD (US);

Inventors:

Jonathan Nichols, Crofton, MD (US);

Mark Seaver, Burtonsville, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method including providing time series structural response data from a structure. A plurality of linear surrogate data series is generated from the time series structural response data. A first generalized correlation function is estimated for each linear surrogate data series of the plurality of linear surrogate data series to generate a confidence interval. The same correlation function is estimated for the time series structural response data. The output of the generalized correlation function applied to the structural response data is compared to the confidence interval. A damage-induced nonlinearity in the structure is indicated when the output of the generalized correlation function applied to the structural response data is outside of the confidence interval.


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